Applied Physics Internship: Data Science and Image Processing for SEM Metrology

Over deze vacature

Introduction The Wafer Metrology group is part of ASML’s Development & Engineering organization, within the Performance & Integration cluster. The group is responsible for developing a robust metrology ecosystem that enables accurate performance assessment and optimization of ASML’s lithography systems. This ecosystem includes state-of-the-art hardware platforms—such as Critical Dimension Scanning Electron Microscopes (CD-SEM) and optical metrology tools—as well as advanced software solutions for image processing, contour extraction, and KPI evaluation. CD-SEM is a cornerstone technology in semiconductor manufacturing and is widely used across both Research & Development (R&D) and High Volume Manufacturing (HVM) to monitor lithographic fidelity, process stability, and yield-critical…

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Data-analist-salarissen in Nederland

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